Metzke, C., Kühnel, F., Weber, J., & Benstetter, G. (2021). Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement, Thermal Contact Areas, Heat Fluxes, and Heat Distribution. Nanomaterials, 11(2), 491.
https://doi.org/10.3390/nano11020491

Ni, W., Niu, C., Zhang, Y., Liu, L., Cui, Y., Fan, H., ... & Lei, G. (2021). Modeling W fuzz growth over polycrystalline W due to He ion irradiations at an elevated temperature. Journal of Nuclear Materials, 550, 152917.
https://doi.org/10.1016/j.jnucmat.2021.152917

Wen, C., Banshchikov, A. G., Illarionov, Y. Y., Frammelsberger, W., Knobloch, T., Hui, F., ... & Lanza, M. (2020). Dielectric Properties of Ultrathin CaF2 Ionic Crystals. Advanced Materials, 32(34), 2002525.
https://doi.org/10.1002/adma.202002525

Fan, H., Zhang, Y., Liu, D., Niu, C., Liu, L., Ni, W., ... & Lei, G. (2020). Tensile stress-driven cracking of W fuzz over W crystal under fusion-relevant He ion irradiations. Nuclear Fusion, 60(4), 046011.
https://doi.org/10.1088/1741-4326/ab71bb

Metzke, C., Frammelsberger, W., Weber, J., Kühnel, F., Zhu, K., Lanza, M., & Benstetter, G. (2020). On the limits of scanning thermal microscopy of ultrathin films. Materials, 13(3), 518.
https://doi.org/10.3390/ma13030518

Wen, C., Jing, X., Hitzel, F. F., Pan, C., Benstetter, G., & Lanza, M. (2019). In situ observation of current generation in ZnO nanowire based nanogenerators using a CAFM integrated into an SEM. ACS applied materials & interfaces, 11(17), 15183-15188.
https://doi.org/10.1021/acsami.9b00447

Bi, Z., Liu, D., Zhang, Y., Liu, L., Xia, Y., Hong, Y., ... & Yan, L. (2019). The evolution of He nanobubbles in tungsten under fusion-relevant He ion irradiation conditions. Nuclear Fusion, 59(8), 086025.
https://doi.org/10.1088/1741-4326/ab2472

Jiang, L., Weber, J., Puglisi, F. M., Pavan, P., Larcher, L., Frammelsberger, W., ... & Lanza, M. (2019). Understanding current instabilities in conductive atomic force microscopy. Materials, 12(3), 459.
https://doi.org/10.3390/ma12030459

Chen, S., Jiang, L., Buckwell, M., Jing, X., Ji, Y., Grustan‐Gutierrez, E., ... & Lanza, M. (2018). On the limits of scalpel AFM for the 3D electrical characterization of nanomaterials. Advanced Functional Materials, 28(52), 1802266.
https://doi.org/10.1002/adfm.201802266

Yang, C., Souchay, D., Kneiß, M., Bogner, M., Wei, H. M., Lorenz, M., ... & Grundmann, M. (2017). Transparent flexible thermoelectric material based on non-toxic earth-abundant p-type copper iodide thin film. Nature communications, 8(1), 1-7.
https://doi.org/10.1038/ncomms16076

Jing, X., Panholzer, E., Song, X., Grustan-Gutierrez, E., Hui, F., Shi, Y., ... & Lanza, M. (2016). Fabrication of scalable and ultra low power photodetectors with high light/dark current ratios using polycrystalline monolayer MoS2 sheets. Nano Energy, 30, 494-502.
https://doi.org/10.1016/j.nanoen.2016.10.032

Fan, H., You, Y., Ni, W., Yang, Q., Liu, L., Benstetter, G., ... & Liu, C. (2016). Surface degeneration of W crystal irradiated with low-energy hydrogen ions. Scientific reports, 6(1), 1-9.
https://doi.org/10.1038/srep23738

Liu, L., Liu, D., Hong, Y., Fan, H., Ni, W., Yang, Q., ... & Li, S. (2016). High-flux He+ irradiation effects on surface damages of tungsten under ITER relevant conditions. Journal of Nuclear Materials, 471, 1-7.
https://doi.org/10.1016/j.jnucmat.2016.01.001

Hamann, L., Benstetter, G., Hofer, A., Mattheis, J., Haas, M., & Zapf-Gottwick, R. (2015). Use of Coated-Metal Particles in Rear Busbar Pastes to Reduce Silver Consumption. IEEE Journal of Photovoltaics, 5(2), 534-537.
https://doi.org/10.1109/JPHOTOV.2014.2388080

Yang, Q., You, Y. W., Liu, L., Fan, H., Ni, W., Liu, D., ... & Wang, Y. (2015). Nanostructured fuzz growth on tungsten under low-energy and high-flux He irradiation. Scientific reports, 5(1), 1-9.
https://doi.org/10.1038/srep10959

Berthold, T., Benstetter, G., Frammelsberger, W., Rodríguez, R., & Nafría, M. (2015). Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques. Applied Surface Science, 356, 921-926.
https://doi.org/10.1016/j.apsusc.2015.08.182

Yang, Q., Fan, H., Ni, W., Liu, L., Berthold, T., Benstetter, G., ... & Wang, Y. (2015). Observation of interstitial loops in He+ irradiated W by conductive atomic force microscopy. Acta Materialia, 92, 178-188.
https://doi.org/10.1016/j.actamat.2015.04.004

Iglesias, V., Lanza, M., Zhang, K., Bayerl, A., Porti, M., Nafría, M., ... & Bersuker, G. (2011). Degradation of polycrystalline HfO2-based gate dielectrics under nanoscale electrical stress. Applied physics letters, 99(10), 103510.
https://doi.org/10.1063/1.3637633

Benstetter, G., Biberger, R., & Liu, D. (2009). A review of advanced scanning probe microscope analysis of functional films and semiconductor devices. Thin Solid Films, 517(17), 5100-5105.
https://doi.org/10.1016/j.tsf.2009.03.176 

G. Benstetter, P. Breitschopf, B. Knoll - US Patent 7,788,732, 2010                          

Frammelsberger, W., Benstetter, G., Kiely, J., & Stamp, R. (2007). C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips. Applied Surface Science, 253(7), 3615-3626.
https://doi.org/10.1016/j.apsusc.2006.07.070

Frammelsberger, W., Benstetter, G., Kiely, J., & Stamp, R. (2006). Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy. Applied Surface Science, 252(6), 2375-2388.
https://doi.org/10.1016/j.apsusc.2005.04.010

Lanza, M.,  (Ed.). (2017). Conductive Atomic Force Microscopy: Applications in Nanomaterials. John Wiley & Sons
ISBN: 978-3-527-34091-0